XCC offers

  XCC brochure

• State-of-the-Art X-ray Diffraction Instrumentation
• Quality Service and Competitive Rates
• Experience and Expertise

• Book on Powder Diffraction, 2nd Edition.

• Our New Location in Wing 5 (MAP).
  

  New Instrumentation:

• Photonic Laue back scattering system:
  - determiantion of the orientation of crystals and grains.

  
  
  

• Bruker D8 Venture Duo single crystal diffractometer: 
  - dual microsource: Cu and Mo radiations, 
  - N-Helix low-temp. system (down to 28K),
  - high pressure Anvil cell. 
  

  and performs

• characterization of materials using non-destructive X-ray diffraction analysis;ion analysis;

• crystal structure determination from single crystal and polycrystalline samples;

• orientation of the crystals and determination of crystallites/grains orientaions.

  Chemical Crystallography:

• provides single crystal structure determination of variety of inorganic, metal-organic, organic and pharmaceutical compounds as well as minerals and intermetallic compounds, including absolute structure determination, treatment of merohedral and non-merohedral twins, disordered, OD and modulated crystals at low, ambient or elevated temperature, in open or inert atmosphere.

  Materials Characterization:

• provides powder X-ray diffraction analysis and characterization of polycrystalline and nano-crystalline materials and thin films, covering phase identification, qualitative and quantitative analysis, degree of crystallinity / amorphous content determination, micro-diffraction and area mapping, samples of any size and shape, crystallite size and micro-strain determination;

• as well as extracts structural information: as ab initio indexing and high precision unit cell refinement, crystal structure refinement using the Rietveld method or pair distribution function, as well as ab initio structure determination from powder diffraction data.

  Advanced Diffraction:

• provides X-ray diffraction measurements for reflectivity (XRR) from thin films using X'Pert Pro MRD system;

• small angle x-ray scattering Xeuss SAXS/WAXS/GISAXS system for proteins, polymers and nanomaterials;

• determination of crystal and crystallites (crystal grains) orientation using Laue backscattering system.

  The Center also

• offers its equipment and expertise for Collaborative research with other local universities, government institution as well as industry located in Maryland, Virginia, Delaware, Washington DC, and nationwide;

• provides Consulting in the field of X-ray diffraction and crystallography, solid state and materials chemistry, forensic analysis, materials characterization, pharmaceuticals, patents, legal issues, and others.