XCC offers

  XCC brochure

• State-of-the-Art X-ray Diffraction Instrumentation
• Quality Service and Competitive Rates
• Experience and Expertise

• Book on Powder Diffraction, 2nd Edition.

• Our New Location in Wing 5 (MAP).
  

  New Instrumentation:

• Photonic Laue back scattering system:
  - determiantion of the orientation of crystals and grains.

  
  
  

• Bruker D8 Venture Duo single crystal diffractometer: 
  - dual microsource: Cu and Mo radiations, 
  - N-Helix low-temp. system (down to 28K),
  - high pressure Anvil cell. 
  

  and performs

• characterization of materials using non-destructive X-ray diffraction analysis (XRD)

• crystal structure determination from single-crystal and polycrystalline samples

• orientation of crystals and determination of crystallites/grains orientaions

• X-ray reflectivity (XRR) and pole figure measurements

• small angle X-ray scattering of polymers, proteins and nanomaterials

  Chemical Crystallography:

• provides single-crystal structure determination for a wide range of materials including: inorganic, metal-organic, organic, and pharmaceutical compounds, as well as minerals and intermetallic compounds

• capabilities include: absolute structure determination; handling merohedral and non-merohedral twins; analysis of disordered, OD and modulated crystals; measurements at low (donw to 20K), ambient or elevated (up to 1500 K) temperature working in open or inert atmosphere

  Materials Characterization:

• provides powder X-ray diffraction analysis and characterization of polycrystalline and nano-crystalline materials and thin films. Service include: phase identification, qualitative, semi-quantitative, and quantitative analysis; determination of the degree of crystallinity / amorphous content determination; micro-diffraction and area mapping; analysis of samples of any size and shape; crystallite size and micro-strain determination, and more

• Elucidates crystallographic and structural information, including: as ab initio indexing and high-precision unit cell determination; crystal structure refinement using the Rietveld or pair distribution function; ab initio structure determination from powder diffraction data

  Advanced Diffraction:

• provides advanced X-ray diffraction measurements of reflectivity (XRR) from thin films using X'Pert Pro MRD system

• small angle X-ray scattering (SAXS/WAXS/GISAXS) with the Xeuss system for proteins, polymers and nanomaterials

• crystal and crystallite (crystal grain) orientation determination using Laue backscattering system

  The Center also

• offers its equipment and expertise for Collaborative research with local universities, government institution, startups, as well as industry located in Maryland, Virginia, Delaware, Washington DC, and across the nation

• provides Consulting in the field of: X-ray diffraction and crystallography; solid-state and materials chemistry; forensic analysis; materials characterization; pharmaceuticals; patents, legal issues; and other specialized areas