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Phase Identification (Qualitative
analysis) using ICDD database;
-
Semi-Quantitative (EVA) & Quantitative (Topas) phase analysis;
-
Ab initio unit cell indexing;
-
High precision lattice parameters determination;
-
Ab initio
crystal structure determination from powder data;
-
The Rietveld refinement of the crystal structure
including accurate phase composition;
-
Fast (up to 1 hour) yet quality data collection
using LynxEye strip detector;
-
High profile quality and low background data
using Solid State detector;
-
Choice of MoKα, CuKα
or single wavelength CuKβ
radiation;
-
Amorphous content/Degree of crystallinity
determination using internal or external
standards;
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Microstructure and texture analysis; crystallite
(grain) size and micro-strain determination;
-
Microdiffraction using Göbbel
mirror and area detector;
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Good data from miniscule samples - several
milligrams and tens of millimeter in size;
-
Large samples up to several kilograms and a foot
long;
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Quality diffraction data and mapping of thin
films (down to nanometer thickness);
-
Effective avoiding of x-ray diffraction from the
single crystal substrate;
-
Standardless amorphous to crystalline single
phase ratio for polymers and pharmaceutics;
-
Neutron data collection & analysis in collaboration with
NIST;
-
Experience and expertise in chemistry, structure
and analysis of all classes:
- metals, alloys and intermetallic compounds;
- inorganic compounds and complexes;
- minerals, zeolites and intercalates;
- organic, metal-organics and organometallic
complexes.
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Powder X-ray characterization of materials with
applications in:
- manufacturing process and quality control;
- raw material analysis in mining;
- drug quality and purity in pharmaceutical industry;
- crystallinity of polymers and nano-materials;
- forensic analysis;
- patent evaluation and more.