- 
                                            
                                                Phase Identification (Qualitative 
								analysis) using ICDD database;
                                         
                                        - 
                                            
                                                Semi-Quantitative (EVA) & Quantitative (Topas) phase analysis;
                                         
                                        - 
                                            
                                                Ab initio unit cell indexing;
                                         
                                        - 
                                            
                                                High precision lattice parameters determination;
                                         
                                        - 
                                            
                                                Ab initio 
								crystal structure determination from powder data;
                                         
                                        - 
                                            
                                                The Rietveld refinement of the crystal structure 
								including accurate phase composition;
                                         
                                        - 
                                            
                                                Fast (up to 1 hour) yet quality data collection 
								using LynxEye strip detector;
                                         
                                        - 
                                            
                                                High profile quality and low background data 
								using Solid State detector;
                                         
                                        - 
                                            
                                                Choice of MoKα, CuKα 
								or single wavelength CuKβ 
								radiation;
                                         
                                        - 
                                            
                                                Amorphous content/Degree of crystallinity 
								determination using internal or external 
								standards;
                                         
                                        - 
                                            
                                                Microstructure and texture analysis; crystallite 
								(grain) size and micro-strain determination;
 
                                         
                                        - 
                                            
                                                Microdiffraction using Göbbel 
								mirror and area detector;
                                         
                                        - 
                                            
                                                Good data from miniscule samples - several 
								milligrams and tens of millimeter in size;
                                         
                                        - 
                                            
                                                Large samples up to several kilograms and a foot 
								long;
                                         
                                        - 
                                            
                                                Quality diffraction data and mapping of thin 
								films (down to nanometer thickness);
                                         
                                        - 
                                            
                                                Effective avoiding of x-ray diffraction from the 
								single crystal substrate;
                                         
                                        - 
                                            
                                                Standardless amorphous to crystalline single 
								phase ratio for polymers and pharmaceutics;
                                         
                                        - 
                                            
                                                Neutron data collection & analysis in collaboration with 
								NIST;
 
                                         
                                        - 
                                            
                                                Experience and expertise in chemistry, structure 
								and analysis of all classes: 
                                                 
                                                
								- metals, alloys and intermetallic compounds;
								- inorganic compounds and complexes;
								- minerals, zeolites and intercalates;
								- organic, metal-organics and organometallic 
								complexes.
 
                                         
                                        - 
                                            
                                                Powder X-ray characterization of materials with 
								applications in: 
                                                
- manufacturing process and quality control;
                                                - raw material analysis in mining;
                                                - drug quality and purity in pharmaceutical industry;
                                                - crystallinity of polymers and nano-materials;
                                                - forensic analysis;
                                                - patent evaluation and more.