X-ray Crystallographic Center at
University of Maryland currently operates 5
diffractometers located in 3 labs: |
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Chemical
Crystallography lab performs single
crystal structure determination using
Bruker CCD systems: |
Bruker Smart Apex2 diffractometer is
equipped with: |
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MoKα sealed X-ray tube;
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The newest Apex2
CCD area detector for rapid data collection
from crystals;
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Graphite
monochromator and Mono cap collimator;
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Motorized detector to crystal distance
from 4 to 15 cm;
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CryoStream 700 low temperature system
working in 80 K - 400 K range;
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Integrated Apex3 software suit for
integration and advanced data treatment.
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Mounting Crystals: |
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The lab is equipped wide field Leica
microscope for crystal selection and mounting which is visualized on wall-mounted TV screen;
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Glove box with microscope/TV system for handling air and humidity sensitive crystals;
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Mounting technique used: MiTeGen loops, glass fibers, capillaries, cactus needles, etc.
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Selection of various viscosity oils for handeling and monting crystal medium.
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Materials Characterization lab
employs powder diffraction using
Bruker C2 Discover and D8 Advance
systems: |
C2/D8 Discover diffractometer with Area detector: |
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CuKα sealed X-ray tube with graphite Göbbel
mirror;
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Vantec 500 area detector for 2D diffraction and high quality patterns from small samples;
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Parallel beam geometry to probe small areas or irregular shaped sample;
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XYZ stage for selecting desired spots and combinatorial screening;
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Capillary spinner for better randomizing crystallite orientation and air sensitive samples;
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Video microscope with laser alignment for precise sample positioning;
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DHS 1200 Hot stage providing high
temperature up to 1200°C under vacuum, Ar or N2.
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D8 Advance diffractometer with LynxEye and SolX: |
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Choice of MoKα and
CuKα radiation;
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9 Position sample changer and scatterless sample holders;
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ICDD powder diffraction database and search/match software;
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EVA software for data treatment;
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Advanced TOPAS software for structure refinement.
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Advance Diffraction lab
includes Small Angle X-ray Scattering and Thin Film Reflectivity
systems: |
Xenocs Xeuss SAXS/WAXS/GISAXS small angle system: |
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5 Meter system with CuKα sealed 30W tube high brightness micro-focus source;
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Parallel beam optics and scatterless slits with automatic alignment;
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Variable Sample-to-Detector distance from 10 to 250 cm;
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300K Dectris Pilatus detector for small angle scattering with a minimum Q = 0.0045 Å-1;
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100K Dectris Pilatus detector for wide angle scattering (up to about 45° 2q);
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Linkam stage controlling temperature from about -100 °C to 250 °C.
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PANalytical XPert Pro MRD system for reflectivity (XRR): |
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Sealed CuKα sealed tube with
parallel beam W-Si mirror;
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Cross slits for incident beam and extra long diffracted beam collimator;
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4 Circle goniometer with XYZ motions;
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Magnetic stage and tape-free mounting T-holder for wafers;
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Attenuator for direct beam measurement.
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New Lab (moving in summer 2020) |
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