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and performs
Chemical Crystallography:
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provides single crystal structure determination
of variety of inorganic, metal-organic, organic
and pharmaceutical compounds as well as minerals
and intermetallic compounds, including absolute
structure determination, treatment of merohedral and non-merohedral twins, disordered,
OD
and modulated crystals at low, ambient or
elevated temperature, in open or inert
atmosphere.
Materials Characterization:
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provides
powder X-ray diffraction analysis and
characterization of polycrystalline and nano-crystalline materials and thin films,
covering phase identification, qualitative and
quantitative analysis, degree of crystallinity /
amorphous content determination,
micro-diffraction and area mapping, samples of
any size and shape, crystallite size and micro-strain determination,
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as well as extract structural information: as ab initio indexing and high precision unit cell
refinement, crystal structure refinement using
the Rietveld method or pair distribution
function, as well as
ab initio structure determination from
powder diffraction data.
Advanced Diffraction:
-
provides
X-ray diffraction measurements for reflectivity
(XRR) from thin films using X'Pert Pro MRD
system and
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small angle x-ray scattering
Xeuss SAXS/WAXS/GISAXS system for proteins,
polymers and nanomaterials.
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The
Center also
- offers its equipment and expertise
for Collaborative research with other
local universities, government institution as
well as industry located
in Maryland, Virginia, Delaware, Washington DC, and
nationwide;
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provides Consulting in the
field of X-ray diffraction and crystallography, solid state and
materials chemistry, forensic analysis, materials characterization, pharmaceuticals, patents,
and others.
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